CAMTEK LTD.
(Translation of Registrant’s Name into English)
Ramat Gavriel
Industrial Zone
P.O. Box 544
Migdal Haemek 23150
ISRAEL
(Address of Principal Corporate Offices)
Indicate by check mark whether the registrant files or will file annual reports under cover of Form 20-F or Form 40-F. Form 20-F x Form 40-F o
Indicate by check mark whether the registrant by furnishing the information contained in this Form is also thereby furnishing the information to the Commission pursuant to Rule 12g3-2(b) under the Securities and Exchange Act of 1934. Yeso No x
Attached hereto as Exhibit 99.1 and incorporated by reference herein is a press release of the registrant, dated August 4, 2003, announcing that Camtek introduction of the “Falcon”, a fast-automated optical inspection system.
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Pursuant to the requirements of the Securities Exchange Act of 1934, the Registrant has duly caused this report to be signed on its behalf by the undersigned, thereunto duly authorized.
| CAMTEK LTD. (Registrant) BY: /S/ MOSHE AMIT —————————————— Moshe Amit Executive Vice President and Chief Financial Officer |
Dated: August 4, 2003
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FOR IMMEDIATE RELEASE
August 4, 2003
CAMTEK CONTACT:
Moshe Amit
+972-4-604-8308 +972-4-604 8300 (fax)
mosheamit@camtek.co.il
MIGDAL HAEMEK, Israel - August 4, 2003 - Camtek Ltd. (NASDAQ: CAMT)
a developer and supplier of intelligent optical inspection systems, today announced the introduction of its new
automated system for optical inspection of semiconductor wafers in their final
manufacturing stages – the FALCON. The Falcon, which was first demonstrated at the
Semicon West 2003 show in San Jose, offers synergistic surface inspection and 3-D
metrology for wafers up to 300 mm in diameter. Camtek plans to install the first systems
in the fourth quarter of 2003.
“Known Good Die (KGD) is a prerequisite for packaging yield, and is getting even more critical in high density and
3-D packaging”, said Rafi Amit, Camtek’s CEO. “Automated Optical Inspection
is quickly becoming an important tool for achieving KGD. The Falcon brings a new level of
inspection capabilities to support enhanced yields and lower packaging costs”.
Built upon Camtek’s experience
of over 10 years in developing intelligent optical inspection systems, the Falcon targets
wafer-level in-line inspection at the FAB end-of-line, bumping and packaging facilities.
On-the-fly scanning detects surface defects from micron to macro-levels, as well as
multiple, missing or misplaced probe marks, bump size and placement deviations. Two
available sensor types provide fast and high precision height measurement for
comprehensive bump height, volume and co-planarity analysis. Off-line setup and review
features maximize utilization.
Camtek Ltd. designs, develops,
manufactures, and markets technologically advanced and cost-effective, intelligent optical
inspection systems and related software products, used to enhance processes and yields for
the printed circuit board, semiconductor packaging and microelectronics industries. Camtek
is a public company since 2000, with headquarters in Migdal Ha’Emek, Israel and
subsidiaries in the U.S., Europe, Japan, and East Asia.
This press release is available
at www.camtek.co.il
This press release may contain projections or other forward-looking statements regarding future events or the future performance of the Company. These statements are only predictions and may change as time passes. We do not assume any obligation to update that information. Actual events or results may differ materially from those projected, including as a result of changing industry and market trends, reduced demand for our products, the timely development of our new products and their adoption by the market, increased competition in the industry, price reductions as well as due to risks identified in the documents filed by the Company with the SEC.
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